Category: ESD testing
EOS, or Electrical Overstress, is any electrical stress that exceeds any of the specified absolute maximum ratings (AMR) of a product. It is important to discuss because many products are damaged this way. This article includes case studies and 3 approaches to handle those requests.
For many years, IC designers coult count on the snapback behaviour of the ggNMOS device for ESD protection in mature CMOS nodes (180nm and below). However, for more advanced CMOS, FinFET, SOI and high voltage processes there are serious drawbacks.