Category: ESD testing

• Automotive CMOS Display EOS ESD design window ESD protection ESD protection approaches ESD testing High Voltage High voltage tolerance IEC 61000-4-5 Local clamp Over voltage tolerant overvoltage tolerant PowerQubic TakeCharge

  3 approaches to handle EOS ‘requirements’

  EOS, or Electrical Overstress, is any electrical stress that exceeds any of the specified absolute maximum ratings (AMR) of a product. It is important to discuss because many products are damaged this way. This article includes case studies and 3 approaches to handle those requests.

  May 27, 2022
• BCD technology ESD design window ESD devices ESD protection ESD protection approaches ESD testing

  Time to say farewell to the snapback ggNMOS for ESD protection

  For many years, IC designers coult count on the snapback behaviour of the ggNMOS device for ESD protection in mature CMOS nodes (180nm and below). However, for more advanced CMOS, FinFET, SOI and high voltage processes there are serious drawbacks.

  February 2, 2022